NUE 2003-2004

Participants

Module Components

Atomic Force Microscopy: Contact Jarek Drelich
	Atomic Force (Scanning Probe) Microscope Dimension 3000	Atomic Force Microscope Nanoscope II
	Dimension 3000 AFM Schematic	Nanoscope II AFM Schematic
		AFM Cantilever Poster
	AFM Cantilever	Jarek Drelich in AFM Lab, M&M Building
	100 nm polystyrene particles forming spherical cluster	Drop Shape Analysis System
	Drop Shape Analysis System	Drop
	Colloidal Probe Poster	JEOL JSM 820 Scanning Electron Microscope
	SEM Image Fly Eye	SEM Image Tick Image Capture
		SEM Image Tick Final Image
	AFM Animation 180 degree rotation Sample size 5x5 microns Small (270K) Flash required	AFM Animation 180 degree rotation Sample size 5x5 microns Large (665 K) Flash required
AFM Animations by J. Drelich and S. E. Hill © 2003 Michigan Technological University Contact S. E. Hill for information about using the animations in a web page.
Related Links
Atomic Force Microscope Animation: IBM Labs AFM Overview: nanoScience Instruments Scanning Probe Microscope (AFM) Animation Gallery: nanoScience Instruments Scanning Probe Microscopy Multimedia AFM Animations: First Atomic Microscope on Mars Image Gallery: Imaging Technology Group Non-Contact AFM Modelling Physics News Graphics: Nanotechnology AFM Videos: Stanford Nanophase Materials Movies: Kai Kadau Introduction to AFM: Bristol Biological Applications of Scanning Probe Microscopy Elastic Force Measurement and Muscle Biology Molecular Expressions: Images from the Microscope "Machines Alive" Documentary 3D Animations Contact Angle Measurements: Institute for Polymer Research SEM Image Gallery: Museum of Science SEM Animation: Museum of Science Virtual Scanning Electron Microscopy using Java Bugscope SEM Animation: Science Learning Network