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Fundamentals of Nanoscale Science and Engineering - Spring 2005

Tour of the FIB and FE-SEM Labs

February 8, 2005

Demonstration by Mr. Owen Mills in the FIB Laboratory

Students in the FIB Lab

Students visit the Hitachi FB-2000A FIB lab.

Owen Mills in the FIB Lab

Owen Mills, Electron Optics Engineer and manager of the FIB and FE-SEM labs, talks about sample loading.

Hitachi FB-2000A FIB

Close-up of the FIB microscope sample holder.

Students in the FIB Lab

Students participate in small groups, along with Associate Professor of Physics Dr. John Jaszczak.

FE-SEM Image

The Hitachi FB-2000A FIB uses a beam of focused high-energy (30kV) Gallium ions both for imaging and for milling specimens.

CAD Representation

Line patterning functions are carried out using the fabrication capabilities or the FIB. The FIB fabrication software facilitates rudimentary CAD drawing or importing of files.

Microscope Demonstration

Owen mills demonstrates image optimization techniques.

Project File

Imaging software window.

 

Demonstration by Dr. John Jaszczak in the FE-SEM Laboratory

Sample Preparation

Bags of sample holders in the Hitachi S-4700 FE-SEM lab.

Handling a Sample

Dr. John Jasczak talks about the carbon nanotube sample provided by Dr. Yoke Khin Yap.

Mounting the Sample

The sample is placed in the microscope.

Sample Holder

The scanning electron microscope detects secondary and backscattered electrons, as well as characteristic x-rays.

Students in the FE-SEM Lab

Students are holding assessment questionnaires for testing their knowledge about nanotechnology.

Hitachi S-4700 FE-SEM

Two different secondary imaging detectors can be used.

Optimizing the Image

Dr. Jaszczak uses Windows-based software for tuning the focus and magnification.

Imaging Software Window

The specimen is a field of carbon nanotubes.

John Jaszczak with interested students

Students become interested watching real-time zooms through several orders of magnitude in scale.

Feature in CNT Sample

Research methodology and instrumentation are demonstrated when studying features of fabricated or natural materials.

Student Driver

A student gets a hands-on lesson in controlling the microscope.

CNT Magnification 110000

Carbon nanotubes with metal catalyst tips, magnification 110000, emission current 9500 nA, working distance 10100 microns.

CNT Magnification 20000

Same sample, magnification 20000, emission current 9500 nA, working distance 10100 microns.

CNT Magnification 8000

Same sample, magnification 8000, emission current 11000 nA, working distance 10000 microns.